Peer Review History: Structural and Opto-Electrical Properties of Cuprous Oxide Thin Film Prepared by Thermal Oxidation Technique

Editor(s):

(1) Dr. Yong X. Gan, California State Polytechnic University, USA.

Reviewers:

(1) Wael Abdullah, Oman.

(2) Joshi P. S, Walchand Institute of Technology, India.

Additional Reviewers:

(1) Roberto López Ramírez, Tecnológico de Estudios Superiores de Jocotitlán, México.

(2) Vijaykumar Bhikaji Sanap, Yeshwantrao Chavan College, India.

Open Peer Review Policy: Click Here

Specific Comment:

Average Peer review marks at initial stage: 8.5/10

Average Peer review marks at publication stage: 9/10

Peer Review History:


Stage 1 | Original Manuscript | File 1 | NA


Stage 2 | Peer review report_1 (Wael Abdullah, Oman) | File 1 | File 2


Stage 2 | Peer review report_2 (Joshi P. S, India) | File 1 | NA


Stage 2 | Revised_MS_v1_and_Feedback_v1 | File 1 | File 2


Stage 3 | Comment_Editor_1_v1 | File 1 | NA